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This paper focus on the design of Programmable Logic BIST structures for Very Large Scale Integration (VLSI) Integrated Circuit(IC) testing. The advancements happening in VLSI technology day by day have made chip testing more complicated. This has paved way for the increased popularity of Logic Built In Self Test (LBIST) compared to Automatic Test Equipment (ATE). Logic BIST allows self testing of...
This paper focus on the design of Programmable MISR(Multiple Input Signature Register) modules for Logic BIST based Very Large Scale Integration(VLSI) Integrated Circuit(IC) testing. The advancement in VLSI technology have made chip testing more complicated which has lead to the popularity of Logic Built In Self Test(LBIST) compared to Automatic Test Equipment(ATE). Logic BIST allows in-built chip...
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