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To enhance System on a Chip (SoC) yield this paper proposes understanding IP contributions. Data structures specific to IP design characteristics for test manufacturing data system can support this goal. This data provides a knowledge foundation and connects the knowledge traditionally siloed into Design, Fab and Test areas. Such a knowledge enhances the ability to comprehend manufacturability at...
To enhance System on a Chip (SoC) yield this paper proposes understanding IP contributions. Data structures specific to IP design characteristics for test manufacturing data system can support this goal. This data provides a knowledge foundation and connects the knowledge traditionally siloed into Design, Fab and Test areas. Such a knowledge enhances the ability to comprehend manufacturability at...
In this work, a new IDDQ built-in self-test (BIST) solution is proposed to provide accurate on-chip current measurements for phase-locked loops (PLLs) found in deep-submicron system-on-chip (SoC) products. The proposed method characterizes PLL loop parameters to increase test quality with minimum additional test time and 4.5% accuracy in IBM 65 nm technology. A self-correction mechanism accompanies...
High speed I/O circuits are becoming increasingly critical as technology scales to increase system bandwidth and decrease power dissipation, die area and system cost. Highly integrated SOCs are currently equipped with large numbers of serial links to enable processing of high bandwidth data streams. There are two major challenges to continued scaling of highspeed I/Os: band-limited channels and timing...
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