The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
HBM (High Bandwidth Memory) is an emerging standard DRAM solution that can achieve breakthrough bandwidth of higher than 256GBps while reducing the power consumption as well. It has stacked DRAM architecture with core DRAM dies on top of a base logic die, based on the TSV and die stacking technologies. In this paper, the HBM architecture is introduced and a comparison of its generations is provided...
A successful integration of Via-middle TSV process in DRAM technology with major process issues is introduced. Fast TSV open/short detection and how to trade-off in choice repair scheme is discussed. Process development for TSV volume shrink required to reduce dynamic power for driving TSV. Fast Cu leak monitor method is essential to sustaining good quality and Fab process control.
FALCON (FAst fauLt COverage estimatioN) is a scalable method for fault grading which uses local fault simulations to estimate the fault coverage of a large system. The generality of this method makes it applicable for any modular design. Our analysis shows that the run time of our algorithm is related to the number of gates and the number of IOs in a module, while fault simulation run time is related...
The success of system test is measured by test quality and cost. System test quality and cost rely on several factors, such as component and board test quality, system test completeness, the support of system diagnostics, and a process that controls overall quality, resource and cost balances. Traditional structural test techniques used at the component level can achieve both high test quality and...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.