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We present here and in the companion paper (Part II) a general framework for the modeling of semiconductor device variability through the physics-based analysis of the small-change sensitivity. We consider a very general class of dynamic device operation, i.e., the periodic or quasi-periodic large signal (LS) time-varying regime, and we evaluate the sensitivity of both dc and harmonic components of...
The paper reviews the current status of noise simulation and modeling for semiconductor devices (in particular, transistors) operated in large-signal (forced) conditions. From a practical standpoint, large-signal noise modeling is relevant in the simulation and design of analog components such as mixers and frequency multipliers. The specific features of cyclostationary noise are discussed, and the...
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