Search results for: Stefanos Valadimas
IEEE Transactions on Computers > 2016 > 65 > 2 > 654 - 663
IEEE Transactions on Computers > 2014 > 63 > 5 > 1277 - 1286
Journal of Electronic Testing > 2013 > 29 > 6 > 795-804
IEEE Transactions on Computers > 2016 > 65 > 2 > 654 - 663
IEEE Transactions on Computers > 2014 > 63 > 5 > 1277 - 1286
Journal of Electronic Testing > 2013 > 29 > 6 > 795-804