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The optimal sub-pattern assignment (OSPA) distance/metric is widely used to evaluate the performance of Multi-target tracking (MTT) algorithms based on random finite sets. Potential shortages of the original OSPA metric are discussed and a comprehensive metric for evaluating performance is established through incorporating the third error component, which represents the error of angles, into the original...
This paper focuses on quickly identifying the unknown or time-varying random latency probability (RLP) of the measurements in the nonlinear networked multi-sensor system by resorting to the efficient implementation of maximization likelihood (ML) estimation. Firstly, the full-probability likelihood computation is equivalently transformed into a log-likelihood function summation form parameterized...
In recent years, the 2.5D IC (Integrated Circuit) package with TSV (Through Silicon Vias) has become important for high-bandwidth and high-performance applications. It is well known that 2.5D technology requires significant innovation in the areas of process technology, packaging, design, thermals, and test solutions leading to several hundred new technologies in a single product. With these complex...
In this paper, the discolor on back-side revealing through-silicon-via (TSV) after wafer thinning and silicon recess process was investigated with various surface analysis methods. According to the analysis results, surface discolor could be raised by Cu oxidation during Si recess process. To eliminate the discolor occurrence, a remedy with in-situ Ar-ion bombardment was proposed which plays a role...
This paper presents the development of a new multi-channel ground penetrating radar (GPR) for Roadbed Disease inspections. Comparing with many existing pavement GPRs of limited survey efficiency, our system have strong joint positioning capability by implementing joint positioning and video system, as well as the customized designed cart-loading units guarantees the operating capability at regular...
Highly semi-polar (101̅3) oriented and fine structural AlN films were successfully prepared on silicon substrate by rf magnetron sputtering in this research. The dependence of the nitrogen concentrations and the material characteristics of the films (crystalline structure and micro morphology) were investigated. The crystalline structure of the films was determined by X-ray diffraction (XRD) and the...
An introduction to the principles behind set-top box manufacturing test. This paper describes why test source format and performance and quality are important for testing set-top box quickly and economically in manufacturing. It gives an overview of the basic architecture of a manufacturing test system, defines the dynamic multiplex algorithm of variable bit-rate TS stream associated with multi-program...
This work presents experimental and molecular dynamics approaches towards deformation and phase transformation mechanisms of monocrystalline Si(100) subjected to nanoindentation. The nanoindentation experiment was conducted with a Berkovich indenter. Following the analysis using cross-sectional transmission electron microscopy with the samples prepared by focused ion beam milling, upon pressure release,...
In this study, the deformation behavior of single-crystal Si (100) was examined using nanoindentation, followed by analysis using cross-sectional transmission electron microscopy (XTEM), scanning electron microscopy (SEM), and Raman microspectroscopy. XTEM samples were prepared by focused ion beam (FIB) milling to accurately position the cross-section through the indentations. The deformation via...
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