The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
The paper presents a model reference adaptive control (MRAC) of first and second order to control the nonlinear dynamics of an atomic force microscope (AFM) cantilever, which is operated in contact mode. The AFM is a powerful tool to measure the topography of a sample at the scale of a few nanometers, where a small sharp tip supported in a micro cantilever scans the surface. In the contact mode the...
Define intelligent control is not an easy task, in the literature we find different definitions of it, which depend on the area of application. Here we will define or view the intelligent control in the context of the control of complex systems. In this context, a control is intelligent when it has the ability to operate and act to control in the best way a complex system which changed suddenly and...
In the literature we found different kind of film conducting polymers, as Polyaniline (PANI) or Polypyrrole (PPY), used as sensor element integrated in a Field Effect Transistor (FET) for the detection of gas or photogenes. In this work we proposed a sensor system prototype based on the combination of a coplanar micro strip (CPμS) waveguide and polymer nanofibers met (electrospun) called, CPμS/PNW...
The paper presents a new control algorithm which consists of a combination of an adaptive control structure and a model predictive one. An atomic force microscope in the contact mode (AFM) is considered to validate the proposed algorithm. The AFM is a powerful tool to measure the topography of the sample at the scale of a few nanometers, where a small sharp tip supported in a micro cantilever scans...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.