Search results for: Massimo Vanzi
Journal of Electronic Materials > 2018 > 47 > 9 > 4959-4963
physica status solidi (RRL) – Rapid Research Letters > 11 > 7 > n/a - n/a
IEEE Photonics Technology Letters > 2017 > 29 > 2 > 197 - 200
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 158 - 163
IEEE Transactions on Nanotechnology > 2016 > 15 > 2 > 274 - 280
Microelectronics Reliability > 2013 > 53 > 9-11 > 1809-1813
Microelectronics Reliability > 2012 > 52 > 5 > 804-812
IEEE Solid-State Circuits Magazine > 2010 > 2 > 3 > 18
Microelectronics Reliability > 2005 > 45 > 9-11 > 1581-1584
Microelectronics Reliability > 1998 > 38 > 4 > 497-506