Search results for: Christof Ebert
IEEE Software > 2017 > 34 > 6 > 98 - 103
IEEE Software > 2017 > 34 > 3 > 33 - 39
IEEE Software > 2017 > 34 > 2 > 112 - 116
IEEE Software > 2017 > 34 > 4 > 82 - 88
IEEE Software > 2016 > 33 > 6 > 27 - 29
IEEE Software > 2016 > 33 > 5 > 110 - 115
IEEE Software > 2016 > 33 > 4 > 111 - 116
IEEE Software > 2016 > 33 > 3 > 94 - 100
Lecture Notes in Computer Science > Product-Focused Software Process Improvement > Keynote Addresses > 2-2
Lecture Notes in Computer Science > New Approaches in Software Measurement > Investigations in Software Process Improvement > 83-93
Lecture Notes in Computer Science > Software Process and Product Measurement > Session A2 – Measurement Programs > 86-96
IEEE Software > 2016 > 33 > 1 > 112 - 116