Search results for: B. Govoreanu
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 288 - 296
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 509 - 516
IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 288 - 296
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 509 - 516