Search results for: Andre G. Metzger
Microelectronics Reliability > 2017 > 79 > C > 361-370
IEEE Transactions on Semiconductor Manufacturing > 2016 > 29 > 4 > 336 - 342
IEEE Transactions on Microwave Theory and Techniques > 2006 > 54 > 12-2 > 4479 - 4488