Search results for: Yeonsung Kim
Microelectronics Reliability > 2016 > 65 > C > 234-242
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 7 > 945 - 955
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2014 > 4 > 10 > 1589 - 1597