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In this paper, we propose an Empirical Mode Decomposition-Ornstein Uhlenbeck (EMD-OU) method, by which we can investigate X-ray Binary (XB) variability. The Ornstein Uhlenbeck (OU) process can homogenize the source based on its own features. The method was used to verify eight high and low mass X-ray Binary data derived from Swift/BAT Website from 2005 to 2013. The results confirm that: The objects...