Search results for: Dongyue Jin
AEUE - International Journal of Electronics and Communications > 2013 > 67 > 4 > 323-328
Microelectronics Reliability > 2009 > 49 > 4 > 382-386
AEUE - International Journal of Electronics and Communications > 2013 > 67 > 4 > 323-328
Microelectronics Reliability > 2009 > 49 > 4 > 382-386