Search results for: Michael Pecht
Microelectronics Reliability > 2012 > 52 > 5 > 762-782
Microelectronics Reliability > 2012 > 52 > 3 > 482-488
Microelectronics Reliability > 2012 > 52 > 2 > 439-445
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 510 - 519
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 482 - 493
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 420 - 427
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 49 - 57
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 470 - 477
IEEE Transactions on Reliability > 2012 > 61 > 1 > 125 - 129
IEEE Transactions on Instrumentation and Measurement > 2012 > 61 > 8 > 2222 - 2229
Journal of Electronic Materials > 2012 > 41 > 9 > 2508-2518