Search results for: Said Hamdioui
Microelectronics Reliability > 2018 > 87 > C > 158-167
International Journal of Circuit Theory and Applications > 46 > 1 > 4 - 28
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3464 - 3472
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 8 > 2206 - 2219
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1444 - 1454
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 1 > 1 - 20
Simulation Modelling Practice and Theory > 2016 > 69 > C > 14-30
Frontiers in Electronic Testing > Testing Static Random Access Memories > Testing single-port and two-port SRAMs > 87-103
Frontiers in Electronic Testing > Testing Static Random Access Memories > Testing single-port and two-port SRAMs > 135-145