Search results for: Cunbo Zhang
Applied Mathematics and Mechanics > 2017 > 38 > 8 > 1109-1126
Microelectronics Reliability > 2016 > 60 > C > 41-47
IEEE Transactions on Plasma Science > 2016 > 44 > 3 > 239 - 244
IEEE Transactions on Electromagnetic Compatibility > 2015 > 57 > 5 > 1132 - 1138
Microelectronics Reliability > 2015 > 55 > 3-4 > 508-513
IEEE Transactions on Electromagnetic Compatibility > 2014 > 56 > 6 > 1545 - 1549