Search results for: Xiang Gao
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 474 - 477
IEEE Transactions on Electron Devices > 2013 > 60 > 10 > 3099 - 3104
IEEE Electron Device Letters > 2011 > 32 > 6 > 755 - 757
IEEE Electron Device Letters > 2011 > 32 > 5 > 617 - 619
IEEE Electron Device Letters > 2011 > 32 > 12 > 1680 - 1682
2010 International Electron Devices Meeting > 30.4.1 - 30.4.4