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This study describes complications introduced by angular direct ionization events on space error rate predictions. In particular, prevalence of multiple-cell upsets and a breakdown in the application of effective linear energy transfer in modern-scale devices can skew error rates approximated from currently available estimation models. This paper highlights the importance of angular testing and proposes...
This paper describes current ongoing research pertaining to the analysis of design radiation hardness for circuits implemented in Field-Programmable Gate Array (FPGA) devices. Radiation induces single event effects in FPGAs that can cause erroneous operation by upsetting data bits or changing logic behavior. Design-level techniques can help mitigate these upsets to some degree; however, there is currently...
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