Serwis Infona wykorzystuje pliki cookies (ciasteczka). Są to wartości tekstowe, zapamiętywane przez przeglądarkę na urządzeniu użytkownika. Nasz serwis ma dostęp do tych wartości oraz wykorzystuje je do zapamiętania danych dotyczących użytkownika, takich jak np. ustawienia (typu widok ekranu, wybór języka interfejsu), zapamiętanie zalogowania. Korzystanie z serwisu Infona oznacza zgodę na zapis informacji i ich wykorzystanie dla celów korzytania z serwisu. Więcej informacji można znaleźć w Polityce prywatności oraz Regulaminie serwisu. Zamknięcie tego okienka potwierdza zapoznanie się z informacją o plikach cookies, akceptację polityki prywatności i regulaminu oraz sposobu wykorzystywania plików cookies w serwisie. Możesz zmienić ustawienia obsługi cookies w swojej przeglądarce.
Although microcontrollers are generally well separated from ESD events happening on a fully equipped and mounted electronic control unit, special configurations expose some microcontrollers to these system-ESD events. In the BISS IC EMC Test Specification [1], several system-level disturbance tests are referenced. One of them is the unpowered system-ESD test according to the international standard...
Various approaches exist to build simulation models for the electromagnetic emission (EME) of digital integrated circuits [1–6]. However, several drawbacks constrain their configuration and usage. A new modelling approach is described in this paper. It is based on the main EME-relevant parameters of digital circuits, i.e. dynamic power and clock rates. This information should be even available before...
Frequency modulation of a clock is a well-known and efficient way to spread clock harmonics around a center frequency, thus reducing emitted narrow-band RF energy. While smoothly changing the clock periods, modulation continuously shifts the clock edges back and forth over a time interval determined by the modulation frequency. The resulting time interval error compared to an unmodulated clock may...
A well defined IC test setup and IC configuration is mandatory to provide EMC-related test reports of different vendors comparable and allows an objective product selection for end-users. Based on well-established international standards, the “BISS” (from “Bosch / Infineon / Siemens Specification”) working group maintains the “Generic IC EMC Test Specification”, which serves as a reference manual...
This paper introduces a new concept, the error-source switching (ESS), for the electromagnetic immunity of microcontrollers. Under the concept of ESS, a microcontroller is a multiple-module IC. A functional module, named as the error source (ES), is the bottleneck for the immunity of microcontrollers. During the sweeping of the disturbance frequency in the RF immunity test, the ES switches between...
Frequency modulation of a clock is a well-known and efficient way to spread clock harmonics around a center frequency, thus reducing emitted narrow-band RF energy. While smoothly changing the clock periods, modulation continuously shifts the clock edges back and forth over a time interval determined by the modulation frequency. The resulting time interval error compared to an unmodulated clock may...
This paper describes the origins of one kind of the degradation of the electromagnetic immunity of microcontrollers. That immunity degradation is strongly frequency dependent. They appear like holes in immunity-frequency curve. Mechanism based on resonance in two types of current loops is introduced to explain the formation of those immunity holes. Measurement results are given to support the introduced...
Podaj zakres dat dla filtrowania wyświetlonych wyników. Możesz podać datę początkową, końcową lub obie daty. Daty możesz wpisać ręcznie lub wybrać za pomocą kalendarza.