A well defined IC test setup and IC configuration is mandatory to provide EMC-related test reports of different vendors comparable and allows an objective product selection for end-users. Based on well-established international standards, the “BISS” (from “Bosch / Infineon / Siemens Specification”) working group maintains the “Generic IC EMC Test Specification”, which serves as a reference manual on how to setup repeatable electromagnetic, pulse and system-ESD tests, resulting in comparable test reports. Conducted and radiated emission and immunity tests are already well established; pulse immunity and ESD robustness measurements based on systemlevel tests are expected to be released in the second edition of the “Generic IC EMC Test Specification” during the first half of 2012. The paper provides an overview of this test specification and its practical application.
