The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Increasing complexity of integrated circuits has forced the industry to abandon partial scan, which necessitates a computationally demanding and unaffordable sequential ATPG, and to rather adopt full scan despite its costs. In this paper, we propose a partial scan scheme driven by a computationally efficient test cube analysis. We tackle the challenges associated with the identification of the conditions...
Scan architectures with compression support have remedied the test time and data volume problems of today's sizable designs. On-chip compression of responses enables the transmission of a reduced volume signature information to the ATE, delivering test data volume savings, while it engenders the challenge of retaining test quality. In particular, unknown bits (x's) in responses corrupt other response...
Despite the advantages of performing response compaction in Integrated-Circuit (IC) testing, unknown response bits (x's) inevitably reflect into loss in test quality. The distribution of these x's within the captured response, which varies for each test pattern, directly impacts the number of scan cells observed through the response compactor. In this work, we propose a two-dimensional X-alignment...
While response compaction reduces the size of expected vectors that need to be stored on tester memory, the consequent information loss inevitably reflects into loss in test quality. Unknown x's further exacerbate the quality loss problem, as they mask out errors captured in other scan cells in the presence of response compactors. In this paper, we propose a technique that manipulates the x distribution...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.