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Increasing complexity of integrated circuits has forced the industry to abandon partial scan, which necessitates a computationally demanding and unaffordable sequential ATPG, and to rather adopt full scan despite its costs. In this paper, we propose a partial scan scheme driven by a computationally efficient test cube analysis. We tackle the challenges associated with the identification of the conditions...
Test data compression is widely employed in scan designs to tackle high test data volume and test time problems. Given the number of scan-in pins available in the ATE, architectural decisions regarding the number of internal scan chains directly impact the compression level attained. While targeting an aggressive compression level by increasing the number of internal scan chains would reduce the test...
Utilisation of input compatibilities alleviates test costs in many applications such as reducing linear feedback shift register (LFSR) size, and scan tree construction among others. Correlation among inputs, identified based on a test set analysis, can be exploited by driving the circuit inputs through fewer channels. The reduction in the number of channels, which is dictated by the number of compatible...
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