The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
Reliability Demonstration Test (RDT) is an essential part of the overall product reliability development life cycle validation and it is required by all customers. This test allows equipment manufacturers to demonstrate that the product meets its intended reliability target. The RDT is generally an intense test with lots of product samples and long hours of testing. It could easily become an expensive...
Increased functional density with shrinking technology could result in escalating noise-induced failures in the field. Further, the low correlation between system level functional test and production test is making it difficult to better screen parts that would fail in the field due to noise. To address these issues, in this paper we present a light-weight fully digital on-chip distributed sensor...
The fact that many software systems are still plagued by critical software bugs conducted researches to deal with methodologies which introduce bugs into the software and recover from them. Since such methodologies need to be well-tested, it necessitates using fault injection techniques to prove their effectiveness. Software Fault Injection (SFI) is defined as the process of deliberately injecting...
Single Event Effects negatively impact the reliability of complex electronic devices and systems. System architects, reliability engineers and digital designers have to invest considerable resources to successfully meet the reliability goals set by the final user or application. The cost of SER mitigation techniques (e.g. additional power and reduced performance) may render the product less competitive...
This paper discusses the challenges, strategy and mitigation methods to prolong the operation of a product even after it is either about to have a failure or have experienced actual failures. The focus is mostly on two component types ASICs and memories. The aging and failure mitigation techniques vary by component type. Design for reliability techniques so far have been focused on measuring the impact...
This paper discusses the value of having a methodology and capability to de-risk the design from stress de-rating point of view and how to improve the bottom line by following and building enough margins in the design.
This paper discusseshallenges and solutions for reliability allocation analysis. The sophistication of today's designs requires a re-evaluation of reliability allocation methodologies to account for complex system designs where a single board could have lots of powerful ICs such as ASICs, FPGAs, Processors, etc. how should the overall system reliability target be divided into various elements?
This paper discusses the value of clear and solid requirements that are the baseline of a system fault management (SFM). It explaines the Failure Modes & Effect Analysis (FMEA) process, how to perform a FMEA, how FMEA is tied to Fault Insertion Test (FIT) and also describes FIT, system diagnostics and its benefits. Finally, each element discussed in this paper has its own value, but as a combination,...
For a number of years products are being impacted by transient faults that cause the systems to fail and returned to suppliers as returned material authorization (RMA). After further analysis, they deemed to be good and no problem found and ultimately sent back out to potential customers and replacements. These returns are most likely being caused by Single Event Upsets. The phenomenon of Single Event...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.