Search results for: Daniel B. Limbrick
IEEE Transactions on Nuclear Science > 2015 > 62 > 4-1 > 1540 - 1549
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2776 - 2781
Microelectronics Reliability > 2013 > 53 > 1 > 114-117
2011 International Reliability Physics Symposium > SE.8.1 - SE.8.7