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A system is presented for extracting key metrics from fonts used in historical documents. The system identifies important landmarks on a page, such as margins, paragraphs, and lines, and applies frequency analysis techniques to identify relevant sizes. The system was validated by comparing its measurements to the measurements of a human expert on randomly selected samples, and differed on average...
No Trouble Found (NTF) and Cannot Duplicate (CND) errors on modern digital electronics are increasingly prevalent and occur at a rate of 50-60% using conventional bench top diagnostics. This work correlates NTF diagnostic errors to Negative Bias Temperature Instability (NBTI), a prominent failure degradation mode and self annealing mechanism in sub-100 nm CMOS technology. NBTI degradation is duplicated...
Single Event Transients (SET) in digital logic pose an ever increasing reliability challenge as device dimensions shrink in modern technologies. Projection of SET sensitivity with scaling is essential to assess the logic failure and error probability in modern technology generations. This paper discusses the effects of device scaling from 45nm to 12nm processes and circuit parameter tuning on SETs...
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