Search results for: Yi-Chueh Shieh
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 61 - 68
IEEE Sensors Journal > 2016 > 16 > 3 > 654 - 661
2012 IEEE Sensors > 1 - 4
2012 IEEE Sensors > 1 - 4
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 61 - 68
IEEE Sensors Journal > 2016 > 16 > 3 > 654 - 661
2012 IEEE Sensors > 1 - 4
2012 IEEE Sensors > 1 - 4