Search results for: Nicholas Tzou
IEEE Transactions on Signal Processing > 2015 > 63 > 24 > 6486 - 6497
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 11 > 2357 - 2370
Journal of Electronic Testing > 2015 > 31 > 1 > 85-98
Journal of Electronic Testing > 2014 > 30 > 2 > 213-228