Search results for: Stephan Eggersgluss
IFIP — The International Federation for Information Processing > VLSI-SoC: Advanced Topics on Systems on a Chip > 1-17
Journal of Electronic Testing > 2014 > 30 > 5 > 557-567
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2011 > 30 > 9 > 1411 - 1415
2010 15th IEEE European Test Symposium > 176 - 181
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 7 > 1125 - 1130
Journal of Electronic Testing > 2010 > 26 > 3 > 307-322