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We are witnessing a technological revolution with a broad impact ranging from daily life (e.g., personalized medicine and education) to industry (e.g., data-driven healthcare, commerce, agriculture, and mining). At the core of this transformation lies "data". This transformation is facilitated by embedded devices, collectively known as Internet of Things (IoT), which produce real-time feeds...
The limitations of traditional general-purpose processors have motivated the use of specialized hardware solutions (e.g., FPGAs) to achieve higher performance in stream processing. However, state-of-the-art hardware-only solutions have limited support to adapt to changes in the query workload.
In spite of significant efforts in circuit testing, sequential circuit testing has remained a challenging problem. Existing test solutions like scan methods are proposed to facilitate Automatic Test Pattern Generation (ATPG), however, these methods suffer from large area and delay overhead. In this paper, a new hybrid history-based test overlapping method is presented to reduce test time in scan-based...
Tapia's syndrome and pressure alopecia (PA) are two rare but distressing complications associated with orotracheal intubation and positioning of the head during surgery. To our knowledge, simultaneous occurrence of both complications after surgery has not been previously reported. To avoid these disturbing complications, the mechanisms of the injury and the preventive measures should be recognized...
In spite of significant efforts in circuit testing, sequential circuit testing has remained a challenging problem. Existing test solutions like scan methods are proposed to facilitate Automatic Test Pattern Generation (ATPG), however, these methods suffer from large area and delay overhead. In this paper, a new hybrid history-based test overlapping method is presented to reduce test time in scan-based...
Increase in the number of transistors has resulted in more vulnerability of digital systems to soft-errors. For a long time, designers have used the worst case scenarios in their designs to alleviate such disturbances, but due to the overall increase in cost in relation with system performance, manufacturing based on worst case scenarios for transient faults is no longer a viable option. Meanwhile,...
By advances in technology, integrated circuits have come to include more functionality and more complexity in a single chip. Although methods of testing have improved, but the increase in complexity of circuits, keeps testing a challenging problem. Two important challenges in testing of digital circuits are test time and accessing the circuit under test (CUT) for testing. These challenges become even...
Complexity in digital systems is pushing the system design more and more toward the two almost separate phases, design of computational units and design of communication structures for connecting these units. As technology grows, these communication networks become more complex and require protection for their reliability. On the other hand, by shrinking transistor geometries, the effects of soft...
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