Search results for: T. Nandha Kumar
Microelectronics Journal > 2017 > 62 > C > 65-71
Integration, the VLSI Journal > 2017 > 56 > C > 61-69
Microelectronics Journal > 2016 > 56 > C > 74-80
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 9 > 1487 - 1498
Integration, the VLSI Journal > 2016 > 55 > C > 1-11
Journal of Electronic Testing > 2016 > 32 > 5 > 587-599