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Embedded memory access time is an important parameter that determines the performance of the memory. To accurately characterize the embedded memory access time across Process, Voltage and Temperature (PVT) variation is always a challenge. In order to get more accurate memory access time data across PVT, the proper implementation of embedded memory access time measurement circuitry and characterization...
The implementation of IDDQ test is increasingly challenging with the shrinking of process geometry in nanotechnologies. This paper presents a case study of the test challenges that the industry is facing in deep submicron process. An IDDQ manufacturing test strategy is discussed to address the challenges.
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