Search results for: C.D. Young
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1338 - 1345
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 123 - 131
IEEE Transactions on Electron Devices > 2007 > 54 > 6 > 1338 - 1345
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 2 > 123 - 131