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Single-ISA heterogeneous chip multiprocessor (CMP) is not only an attractive design paradigm but also is expected to occur as a consequence of manufacturing imperfections, such as process variation and permanent faults. Process variation could cause cores to have different maximum frequencies; whereas permanent faults could cause losses of functional units and/or cache banks randomly distributed on...
Soft error reliability has become a first-order design criterion for modern microprocessors. Architectural Vulnerability Factor (AVF) modeling is often used to capture the probability that a radiation-induced fault in a hardware structure will manifest as an error at the program output. AVF estimation requires detailed microarchitectural simulations which are time-consuming and typically present aggregate...
Soft error reliability is increasingly becoming a first-order design concern for microprocessors, as a result of higher transistor counts, shrinking device geometries and lowering of operating voltages. It is important for designers to be able to validate whether the Soft Error Rate (SER) targets of their design have been met, and help end users select the processor best suited to their reliability...
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