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In this paper, a recently proposed automatic and sequential sampling and modeling algorithm for near-field scanning of printed circuit boards and/or integrated circuits is further optimized in two ways. The main goal of this optimization is to reduce the total measurement time needed to come to a complete model of the near-field distribution over the full scan area. The first optimization is that...
In this paper, a practical implementation of a recently proposed automatic and sequential sampling algorithm for the near-field scanning of printed circuit boards and/or integrated circuits is presented. The sampling algorithm minimizes the required number of sampling points by making a balanced tradeoff between ‘exploration’ and ‘exploitation’. Moreover, at every moment analytical models for the...
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