Search results for: R. Coquand
2016 IEEE International Electron Devices Meeting (IEDM) > 17.6.1 - 17.6.4
2012 International Electron Devices Meeting > 8.7.1 - 8.7.4
2012 International Electron Devices Meeting > 28.1.1 - 28.1.4
IEEE Electron Device Letters > 2012 > 33 > 11 > 1526 - 1528
IEEE Electron Device Letters > 2012 > 33 > 9 > 1225 - 1227