The Infona portal uses cookies, i.e. strings of text saved by a browser on the user's device. The portal can access those files and use them to remember the user's data, such as their chosen settings (screen view, interface language, etc.), or their login data. By using the Infona portal the user accepts automatic saving and using this information for portal operation purposes. More information on the subject can be found in the Privacy Policy and Terms of Service. By closing this window the user confirms that they have read the information on cookie usage, and they accept the privacy policy and the way cookies are used by the portal. You can change the cookie settings in your browser.
We propose a comprehensive yet low-cost solution for online detection and diagnosis of permanent faults in on-chip networks. Using error syndrome collection and packet/flit-counting techniques, high-resolution defect diagnosis is feasible in both datapath and control logic of the on-chip network without injecting any test traffic or incurring significant performance overhead.
Integrating optical interconnects into the next-generation multi-/many-core architecture has been considered a viable solution to addressing the limitations in throughput, latency, and power efficiency of electrical interconnects. Optical interconnects also allow the performance growth of inter-core connectivity to keep pace with the growth of the cores' processing ability. However, variations in...
We propose a comprehensive solution for end-to-end (e2e) error correction and online defect diagnosis for on-chip networks. For e2e error correction, we propose an interleaved error-locality-aware code that efficiently corrects both random and burst errors. We demonstrate that for 64-bit wide network links, interleaving four of the proposed code, 2G4L(26,16), each of which supports 16bit data, can...
It becomes increasingly difficult to achieve a high manufacturing yield for multicore chips due to larger chip sizes, higher device densities, and greater failure rates. By adding a limited number of spare cores and wires to replace defective cores and wires either before shipment or in the field, the effective yield of the chip and its overall cost can be significantly improved. In this paper, we...
In this paper, we propose a quality metric for an NoC and model the yield and cost of a spare-enhanced multi-core chip subject to a given quality constraint. Our experiments show that the overall quality of a mesh-based NoC depends more on the reliability of the inner links than the outer links; therefore, a non-uniform distribution of spare wires could be more effective and cost efficient than a...
Set the date range to filter the displayed results. You can set a starting date, ending date or both. You can enter the dates manually or choose them from the calendar.