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Novel procedure to realize a high ESD robustness with small variation for 40V p-ch LDMOS is proposed. By optimizing the drain structure, current flow path detaches from highest electric field point during ESD events, which leads to improve both HBM robustness and its variation. By using this procedure, the device length (the length between drain and source contact) increase could be suppressed from...
The objective of reconstruction-based super-resolution is to construct a high-resolution image from a sequence of low-resolution images. The super-resolution processing requires precise registration of low-resolution images and the registration error degrades the resulting high-resolution image. In order to handle inaccuracies in registration, the robust super-resolution methods have been proposed...
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