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Ultra-Wideband (UWB) technology is considered to be the most suitable technology to indoor wireless location technology and IEEE 802.15.4a is the first physical layer standards used for wireless ranging and positioning in IEEE. There is no malicious network equipment in ideal circumstances, but there are snoopers, impostors and jammers in reality. There are authentication and encryption supports in...
60GHz wireless communication technology is considered to be one of the most promising technology in future wireless communication domains. The information of the DOA (direction of arrival) is the foundation for adaptive array antenna to adjust the optimal beam direction as well as track mobile terminal, and the method to obtain the precise DOA is the key technology of the adaptive beam forming. The...
Generally, it is very difficult to locating a resistive via defect in function failure analysis in CMOS circuit. This type defect could not be located directly by Photon emission microscopy analysis or other failure analysis techniques. In this paper, a useful method is introduced to show how to locate a resistive via defect. Some cases are presented in detail. And some valuable experiences are shared...
Photon emission microscopy analysis with the combination of OBIRCH analysis are very effective for defect localization, which can decrease analysis cycle time and improve success rates remarkably. In this paper, some cases are presented to show how to locate defects quickly by photon emission microscopy analysis with the combination of OBIRCH analysis.
In our laboratory, Soft Defect Localization (SDL) technique without a synchronization signal is realized by Optical Beam Induced Resistance Change (OBIRCH). But the accuracy of this SDL technique depends on power supply voltage, pixel dwell time and test program duration. In this paper, we will present experimental results to show how to affect the accuracy of SDL technique by these three factors.
Failure analysis on advanced logic and mixed signal ICs more and more has to deal with so called dasiasoft defectpsila. In this paper, a novel method to realize Soft Defect Localization (SDL) techniques without a synchronization signal for failure analysis is presented. We will present experimental results showing the accuracy of this method in order to help failure analysis to localize defect in...
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