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A new quantum interferometric technique for measuring polarization mode dispersion with a higher precision than classical techniques is introduced. This approach simultaneously allows extracting chromatic and polarization mode dispersion parameters from a single optical setup.
We introduce two new devices, the correlation confocal and twin-photon microscopes. Like the standard two-photon confocal microscope, they use spatially-correlated photon pairs to improve lateral resolution, but with the correlation enforced in different manners.
We discuss an apparatus capable of producing correlated-photon “ghost” images that cancel all object-induced aberrations in a particular plane and all odd-order aberrations induced by the image-forming optics. We show that both entangled and classically correlated light sources can produce the desired spatial-aberration cancellation.
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