Search results for: Marius Neag
Microelectronics Reliability > 2017 > 79 > C > 509-516
Circuits, Systems, and Signal Processing > 2016 > 35 > 1 > 253-279
IEEE Transactions on Circuits and Systems I: Regular Papers > 2015 > 62 > 3 > 625 - 634
IEEE Transactions on Circuits and Systems I: Regular Papers > 2014 > 61 > 1 > 247 - 257
Procedia Engineering > 2014 > 69 > Complete > 1345-1349
CAS 2013 (International Semiconductor Conference) > 1 > 11 - 16
CAS 2013 (International Semiconductor Conference) > 2 > 211 - 214
CAS 2012 (International Semiconductor Conference) > 2 > 385 - 388