Search results for: Kuan-Neng Chen
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1666 - 1673
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 129 - 135
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1666 - 1673
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 129 - 135