Search results for: Kuan-Neng Chen
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 129 - 135
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 927 - 933
IEEE Electron Device Letters > 2014 > 35 > 8 > 865 - 867
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 129 - 135
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 927 - 933
IEEE Electron Device Letters > 2014 > 35 > 8 > 865 - 867