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Progressive technology scaling raises the need for efficient VLSI design methods facing the increasing vulnerability to permanent physical defects, while considering power efficiency of resulting circuit implementations at the same time. Triple Modular Redundancy (TMR) represents a common method to encounter reliability problems, but has the drawback of increased area and power consumption. This work...
Due to aggressive scaling, reliability issues influence the design process of integrated circuits more and more. A well known technique to tackle these issues represents Triple Modular Redundancy (TMR). It strongly improves reliability of a design at the expense of at least tripled area and power consumption. In this contribution, we propose an enhanced TMR approach that significantly decreases the...
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