Search results for: Ming-Dou Ker
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3979 - 3985
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3519 - 3523
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1996 - 2002
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3193 - 3198
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3625 - 3631
IEEE Transactions on Microwave Theory and Techniques > 2013 > 61 > 2 > 914 - 921
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 110 - 118
IEEE Journal of Solid-State Circuits > 2011 > 46 > 2 > 537 - 545
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 3 > 474 - 483
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 238 - 246
IEEE Electron Device Letters > 2010 > 31 > 2 > 159 - 161
IEEE Transactions on Circuits and Systems I: Regular Papers > 2010 > 57 > 5 > 1039 - 1047
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3149 - 3159
IEEE Transactions on Circuits and Systems II: Express Briefs > 2009 > 56 > 5 > 359 - 363
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1466 - 1472
IEEE Electron Device Letters > 2009 > 30 > 4 > 389 - 391
IEEE Transactions on Microwave Theory and Techniques > 2008 > 56 > 5-2 > 1286 - 1294
IEEE Transactions on Electromagnetic Compatibility > 2008 > 50 > 4 > 810 - 821
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 549 - 560
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 438 - 445