Search results for: Ming-Dou Ker
2011 International Reliability Physics Symposium > EL.2.1 - EL.2.2
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 238 - 246
IEEE Transactions on Electron Devices > 2009 > 56 > 12 > 3149 - 3159
2009 31st EOS/ESD Symposium > 1 - 6
IEEE Transactions on Electron Devices > 2009 > 56 > 7 > 1466 - 1472