Wyniki wyszukiwania dla: Ming-Dou Ker
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3979 - 3985
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 238 - 246
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3979 - 3985
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 238 - 246