Search results for: Ming-Dou Ker
2011 International Reliability Physics Symposium > EL.2.1 - EL.2.2
IEEE Journal of Solid-State Circuits > 2011 > 46 > 2 > 537 - 545
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 238 - 246
IEEE Electron Device Letters > 2010 > 31 > 2 > 159 - 161
IEEE Transactions on Circuits and Systems I: Regular Papers > 2010 > 57 > 5 > 1039 - 1047