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Super luminescent diode (SLD) is a typical product with long lifetime and high reliability which has great advantages and wide application prospects in many areas. Accelerated degradation testing (ADT) is used to obtain performance parameter data in a short time and extrapolate the lifetime and reliability of the products under normal operation conditions. However, in the application of Super luminescent...
In this paper the Dempster-Shafer theory of evidence is utilized in comprehensive assessment of the reliability enhancement testing (RET). The basic concept of the D-S theory and the rule of evidence-combination are introduced. Moreover, the approach to the assessment of the RET utilizing the D-S theory of evidence is presented. Firstly a recognition frame for all possible effects of RET programs...
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