Search results for: J Aelterman
Journal of Microscopy > 271 > 3 > 239 - 254
2010 IEEE International Conference on Image Processing > 1653 - 1656
IET Science, Measurement & Technology > 2009 > 3 > 4 > 302 - 311
Journal of Microscopy > 271 > 3 > 239 - 254
2010 IEEE International Conference on Image Processing > 1653 - 1656
IET Science, Measurement & Technology > 2009 > 3 > 4 > 302 - 311